Cross sections for L2,3 Auger emission in 22- to 300-keV H+ + Ar collisions
نویسندگان
چکیده
منابع مشابه
Symmetric versus asymmetric collisions in ion-induced Auger emission from silicon
We investigate the production of Si 2p Auger electrons during bombardment of Si surfaces by 1.0-5.1 keV Ar+ ions. Yields of Auger electrons emitted at 146 a with respect to the ion beam are measured as a function of ion energy. We observe a threshold of 3.8 keV for formation of a double L vacancy in Si, which is due to Ar-Si collisions. This value is higher than those of previous studies, which...
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